About

Scope

Standardization of methods for instrument specification, instrument calibration, instrument operation, data acquisition, data processing, and data analysis in the use of X-ray Reflectometry (XRR) and X-ray Fluorescence (XRF) Analysis for surface chemical and structural analysis.

Quick links

1
published ISO standard *

under the direct responsibility of ISO/TC 201/SC 10

2
ISO standards under development *

under the direct responsibility of ISO/TC 201/SC 10

12
Participating members
2
Observing members

* number includes updates

Reference Title Type
ISO/TC 201/SC 10/WG 1   XRF technique Working group

 

Liaison Committees from ISO/TC 201/SC 10

ISO/TC 201/SC 10 can access the documents of the committees below:

Reference Title ISO/IEC
ISO/TC 147 Water quality ISO
ISO/TC 202 Microbeam analysis ISO
ISO/TC 229 Nanotechnologies ISO

ISO/TC 201/SC 10 - Secretariat

JISC [Japan]

Japan National Committee for Standardization of Surface Chemical Analysis
#202 Belcom Tsukuba Building
1-2-3 Ninomiya,
Tsukuba
Ibaraki 305-0051
Japan