ISO 17470:2004
Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
Reference number
ISO 17470:2004
Edición 1
2004-09
Retirada
ISO 17470:2004
30680
Retirada (Edición 1, 2004)

Resumen

ISO 17470:2004 gives guidance for the identification of elements and the investigation of the presence of specific elements, within a specific volume, contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

Informaciones generales

  •  : Retirada
     : 2004-09
    : Retirada de la Norma Internacional [95.99]
  •  : 1
     : 10
  • ISO/TC 202/SC 2
    71.040.99 
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