Resumen
ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.
ISO 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.
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Informaciones generales
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Estado: PublicadoFecha de publicación: 2014-04Etapa: Cierre de la revisión [90.60]
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Edición: 2Número de páginas: 20
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Comité Técnico :ISO/TC 202/SC 1
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Ciclo de vida
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Anteriormente
RetiradaISO 22493:2008
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Ahora
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