International Standard
ISO 18118:2024
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Reference number
ISO 18118:2024
Edición 3
2024-02
International Standard
Vista previa
ISO 18118:2024
81742
No disponible en español
Publicado (Edición 3, 2024)

ISO 18118:2024

ISO 18118:2024
81742
Idioma
Formato
CHF 129
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Resumen

This document gives guidance on the measurement and use of experimentally-determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy. The methods described only apply to polycrystalline and amorphous materials, as effects inherent to single-crystal samples are not addressed.

Informaciones generales

  •  : Publicado
     : 2024-02
    : Norma Internacional publicada [60.60]
  •  : 3
     : 22
  • ISO/TC 201/SC 7
    71.040.40 
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