Résumé
ISO 11952:2014 specifies methods for characterizing and calibrating the scan axes of scanning-probe microscopes for measuring geometric quantities at the highest level. It is applicable to those providing further calibrations and is not intended for general industry use, where a lower level of calibration might be required.
Informations générales
-
État actuel: AnnuléeDate de publication: 2014-05Stade: Annulation de la Norme internationale [95.99]
-
Edition: 1
-
Comité technique :ISO/TC 201/SC 9ICS :71.040.40
- RSS mises à jour
Cycle de vie
-
Actuellement
-
Révisée par
PubliéeISO 11952:2019