Subcommittee Subcommittee Title Published standards Standards under development
ISO/TC 202/SC 1 Terminology 3 2
ISO/TC 202/SC 2 Electron probe microanalysis 8 2
ISO/TC 202/SC 3 Analytical electron microscopy 6 0
ISO/TC 202/SC 4 Scanning electron microscopy 4 1
Filter :
Standard and/or project under the direct responsibility of ISO/TC 202 Secretariat Stage ICS
Microbeam analysis — MSA/MAS/AMAS hyper-dimensional data file specification (HMSA)
20.00
Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
95.99
Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
60.60
Microbeam analysis — Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
95.99
Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
95.99
Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
60.60
Microbeam analysis — Methods of specimen preparation for analysis of general powders using WDS and EDS
60.60
Standard file format for spectral data exchange
95.99
Microbeam analysis — EMSA/MAS standard file format for spectral-data exchange
95.99
Microbeam analysis — EMSA/MAS standard file format for spectral-data exchange
60.60
Microbeam analysis — Quantitative analysis using energy-dispersive spectrometry (EDS)
95.99
Microbeam analysis — Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
90.60
Microbeam analysis — Guidelines for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
60.60
Microbeam analysis — Electron backscatter diffraction — Quantitative determination of austenite in steel
60.60
Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
90.92
Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
30.99

No matching records found. Please try changing the filter settings.