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Standard and/or project under the direct responsibility of ISO/TC 202/SC 1 Secretariat Stage ICS
Microbeam analysis — Analytical electron microscopy — Vocabulary
90.60
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
20.00
Microbeam analysis — Scanning electron microscopy — Vocabulary
95.99
Microbeam analysis — Scanning electron microscopy — Vocabulary
90.60
Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
20.60
Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
95.99
Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
90.60

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