Abstract
The method specified is applicable to sulfur contents between 0,0003 % (m/m) and 0,010 % (m/m). However, niobium, silicon, tantalum and titanium interfere in the determination of sulfur, and application range and test portion masses of the method depend on the concentration of the interfering elements.
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General information
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Status: PublishedPublication date: 1994-04Stage: International Standard confirmed [90.93]
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Edition: 1Number of pages: 10
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Technical Committee :ISO/TC 17/SC 1ICS :77.080.01
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