ISO 3274:1996
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ISO 3274:1996
1916

Abstract  Preview

Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.


General information 

  •  :  Published
     : 1996-12
  •  : 2
     : 13
  •  : ISO/TC 213 Dimensional and geometrical product specifications and verification
  •  :
    17.040.30 Measuring instruments

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std 2 88 Paper
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