Abstract

Describes the metrological characteristics of phase correct filters for the measurement of surface profiles. In particular it specifies how to separate the long and short wave content of a surface profile.


General information 

  • Status
     : Withdrawn
    Publication date
     : 1996-12
  • Edition
     : 1
    Number of pages
     : 8
  • Technical Committee
     : ISO/TC 213 Dimensional and geometrical product specifications and verification
  • ICS
     :
    17.040.20 Properties of surfaces

Life cycle

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