ISO/TR 17055:2002

Published (Edition 1, 2002)

ISO/TR 17055:2002

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Abstract

ISO/TR 17055 specifies a method for the determination of the content of silicon in steel by means of inductively coupled plasma emission spectrometry. The method is applicable to silicon contents of mass fraction 0,02 % to 5 %.

The method uses a calibration based on a very close matrix matching of the calibration solutions to the sample and close bracketing of the contents around the approximate concentration of silicon in the sample to be analysed. The concentrations of all elements in the sample has, therefore, to be approximately known. If the concentrations are not known the sample has to be analysed by some semi quantitative method.

General information

Status
: Published

Publication date
: 2002-04

Stage
: International Standard published [60.60]
Edition
: 1

Number of pages
: 9
Technical Committee :
ISO/TC 17/SC 1

ICS :
77.080.20
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