ISO 17526:2003 covers terms and definitions as well as test methods and evaluation procedures to characterize, estimate and predict the longterm behaviour of various types of lasers.
It defines terms for the lifetime of lasers and specifies test procedures and fundamental aspects for the determination of lifetime. It applies for all types of lasers for which lifetime is a critical issue, including diode lasers except those used in telecommunications.
Status: PublishedPublication date: 2003-06
Edition: 1Number of pages: 12
Technical Committee: ISO/TC 172/SC 9 Laser and electro-optical systems
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