ISO/TS 10867:2010
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ISO/TS 10867:2010
46245

Abstract 

ISO/TS 10867:2010 provides guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.

ISO/TS 10867:2010 provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNT in a sample and their relative integrated PL intensities.

The method can be expanded to estimate relative mass concentrations of semi-conducting SWCNTs in a sample from measured integrated PL intensities and knowledge of their PL cross-sections.


General information 

  •  :  Withdrawn
     : 2010-09
  •  : 1
     : 14
  •  : ISO/TC 229 Nanotechnologies
  •  :
    07.120 Nanotechnologies

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