Abstract
PreviewISO 7637-3:2016 defines bench test methods to evaluate the immunity of devices under test (DUTs) to transient pulses coupled to lines other than supply lines. The test pulses simulate both fast and slow transient disturbances caused by the switching of inductive loads and relay contact bounce.
The following three test methods are described in ISO 7637-3:2016:
- capacitive coupling clamp (CCC) method;
- direct capacitive coupling (DCC) method;
- inductive coupling clamp (ICC) method.
ISO 7637-3:2016 applies to road vehicles fitted with nominal 12 V or 24 V electrical systems.
For transient pulses immunity, Annex B provides recommended test severity levels in line with the functional performance status classification (FPSC) principle described in ISO 7637‑1.
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Status: PublishedPublication date: 2016-07
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Edition: 3Number of pages: 25
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Technical Committee: ISO/TC 22/SC 32 Electrical and electronic components and general system aspects
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- ICS :
- 43.040.10 Electrical and electronic equipment
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| Format | Language | |
|---|---|---|
| std 1 124 | ||
| std 2 124 | Paper |
- CHF124
Life cycle
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Previously
WithdrawnISO 7637-3:2007
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