This document is intended to aid the operators of X-ray photoelectron spectrometers in their analysis of typical samples. It takes the operator through the analysis from the handling of the sample and the calibration and setting-up of the spectrometer to the acquisition of wide and narrow scans and also gives advice on quantification and on preparation of the final report.
Status: PublishedPublication date: 2019-08
Edition: 2Number of pages: 32
Technical Committee: ISO/TC 201/SC 7 Electron spectroscopies
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