ISO 17470:2014
p
ISO 17470:2014
64783

Status : Published (Under review)

This standard was last reviewed and confirmed in 2019. Therefore this version remains current.
en
Format Language
std 1 63 PDF + ePub
std 2 63 Paper
  • CHF63
Convert Swiss francs (CHF) to your currency

Abstract

ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

Read sample 

Preview this standard in our Online Browsing Platform (OBP)

General information

  •  : Published
     : 2014-01
    : International Standard confirmed [90.93]
  •  : 2
     : 10
  • ISO/TC 202/SC 2
    71.040.99 
  • RSS updates

Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)